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Modified Timoshenko formula for bending of ultrathin strained bilayer films
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10.1063/1.2828043
/content/aip/journal/apl/92/2/10.1063/1.2828043
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/2/10.1063/1.2828043
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Diameters of pure Si micro- and nanotubes as a function of thickness of Si layer with fixed thickness of strained Si layer at . See Ref. 16 for experimental details.

Image of FIG. 2.
FIG. 2.

Diameters of nanotubes as a function of thickness of GaAs layer with fixed thickness of InAs layer at 2 ML. See Ref. 11 for experimental details.

Image of FIG. 3.
FIG. 3.

Physical and geometric parameters used for the derivation.

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/content/aip/journal/apl/92/2/10.1063/1.2828043
2008-01-15
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Modified Timoshenko formula for bending of ultrathin strained bilayer films
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/2/10.1063/1.2828043
10.1063/1.2828043
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