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Microstructure and recording mechanism of Bi–Fe–(N) layer for high-density write-once optical disk
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10.1063/1.2828335
/content/aip/journal/apl/92/2/10.1063/1.2828335
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/2/10.1063/1.2828335
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Variation of PRSNR and sbER of disk samples vs the write power .

Image of FIG. 2.
FIG. 2.

Eye patterns of random signals read directly from oscilloscope.

Image of FIG. 3.
FIG. 3.

TEM image of recording marks in an optical disk sample. The SAED patterns attached on upper and lower right-hand corners of TEM image were taken from the nonmark and mark areas, respectively.

Image of FIG. 4.
FIG. 4.

Variations of chemical compositions deduced from the EDS analysis in the mark and its vicinity. Locations of EDS analysis are specified in inserted TEM micrograph.

Image of FIG. 5.
FIG. 5.

TEM micrograph of as-deposited Bi–Fe layer. The attached SAED pattern indicates that the film is polycrystalline and dark, coarse grains are Bi-rich phase as revealed by EDS analysis.

Image of FIG. 6.
FIG. 6.

XPS peaks of (a) Bi–N and (b) Fe–N bonds in an as-deposited and a Bi–Fe–(N) layer subjected to a rapid heating to .

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/content/aip/journal/apl/92/2/10.1063/1.2828335
2008-01-17
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Microstructure and recording mechanism of Bi–Fe–(N) layer for high-density write-once optical disk
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/2/10.1063/1.2828335
10.1063/1.2828335
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