Full text loading...
Variation of PRSNR and sbER of disk samples vs the write power .
Eye patterns of random signals read directly from oscilloscope.
TEM image of recording marks in an optical disk sample. The SAED patterns attached on upper and lower right-hand corners of TEM image were taken from the nonmark and mark areas, respectively.
Variations of chemical compositions deduced from the EDS analysis in the mark and its vicinity. Locations of EDS analysis are specified in inserted TEM micrograph.
TEM micrograph of as-deposited Bi–Fe layer. The attached SAED pattern indicates that the film is polycrystalline and dark, coarse grains are Bi-rich phase as revealed by EDS analysis.
XPS peaks of (a) Bi–N and (b) Fe–N bonds in an as-deposited and a Bi–Fe–(N) layer subjected to a rapid heating to .
Article metrics loading...