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Energy level alignment and injection barriers at spin injection contacts between and organic semiconductors
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We have determined the energy level alignment at interfaces between and two typical organic semiconductors, copper-phthalocyanine and -sexithiophene. thin films have been grown using pulsed laser deposition and subsequently ex situcleaned before the organic materials have been deposited. This procedure is often applied in the fabrication of organic devices. We show that under these conditions the interfaces are free from chemical interaction and characterized by a short range interface dipole and large charge injection barriers.
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