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Measurement of semiconductor waveguide optical properties in the midinfrared wavelength range
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10.1063/1.2830829
/content/aip/journal/apl/92/2/10.1063/1.2830829
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/2/10.1063/1.2830829

Figures

Image of FIG. 1.
FIG. 1.

Experimental setup for propagation loss measurements. The glow bar beam (TE or TM polarized) is focused on the ridge front facet. The transmitted light emerging from the rear facet is focused on a HgCdTe detector. Rear facet and transmitted light can also be imaged on a QWIP camera, as shown on the figure.

Image of FIG. 2.
FIG. 2.

(a) Glow bar emission transmitted through the different optical elements (without waveguide) of the setup. (b) Glow bar emission transmitted by the waveguide. The two gray arrows correspond to the two regions where a zoom is performed in (c). [(c) and (d)] Zoom on the two regions with a common vertical scale.

Image of FIG. 3.
FIG. 3.

Fourier transform of the spectra shown in Fig. 2(c), centered around (a) and (b) around . Inset: zoom on the and orders in a linear scale.

Image of FIG. 4.
FIG. 4.

Transmission oscillations of the QCL (square) and blackbody (circles) around in a ridge.

Tables

Generic image for table
Table I.

Sum up of the optical properties (effective index and propagation loss) for the two wavelength ranges under study.

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/content/aip/journal/apl/92/2/10.1063/1.2830829
2008-01-14
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measurement of semiconductor waveguide optical properties in the midinfrared wavelength range
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/2/10.1063/1.2830829
10.1063/1.2830829
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