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Topography (a), thermally modulated fluorescence (b), and room temperature fluorescence images (c) of a wide nickel stripe.
Linescans across the nickel stripe: room temperature fluorescence (blue-dotted curve), thermally modulated fluorescence (thin black curve), and thermally modulated fluorescence normalized by the fluorescence (thick red curve). The curves are extracted from Figs. 2(b) and 2(c) and are the average between ten adjacent linescans. The gray rectangle indicates the position of the nickel wire. The curved black arrows indicate the zones where heat diffusion occurs in the dielectric layer.
Schematic representation of the heat transfer paths between the wire and the probe: through the dielectric layer (thick red arrow), and through the air (dotted red arrow). The large brown arrow represents the heat transfer toward the silicon substrate. The layer thicknesses are also indicated.
Tip approach curves on a wide nickel stripe. The curves represent the tip oscillation amplitude (red-dotted line with circular symbols, left scale) and the normalized thermally modulated fluorescence (full blue curve with square symbols, right scale) as a function of the tip/sample average distance. The -axis origin was arbitrarily set at the value of the oscillation amplitude where it is divided by two. The inset is a zoom of the contact zone.
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