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The snapshot of the transient state at the very early switching stage.
The loops of the fatigued PZT thin films simulated by our previous model with different (lines) (a) and the fatigue profiles of PZT thin films simulated by this model (lines) with different for different relaxation times at voltage before the driving voltage, (b), are compared with the experimental results (symbols) reported in Refs. 13 and 23 .
The dependence of fatigue on electric field strength of the PZT thin films (a) and the temperature dependence of fatigue (b) predicted by the model (lines) without adjusting the parameters are compared with the experimental results (symbols) reported in Refs. 26 and 28 .
The experimental data of PZT/Pt fatigue at (bottom curve) and at (top curve) reported in Ref. 10 . The lines represent the modeling prediction. The parameters used in the model are not adjustable.
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