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(a) FE-SEM image of aligned wrapped -type SWCNT. (b) The statistics of aligned tubes based on accumulated data. (c) line of the polarized Raman spectra. The inset exhibits the ratio between the peak and background for this aligned -type SWCNT based film.
(a) Thermoelectricity developed in the -type SWCNT samples. Each of the curves contains two branches representing up and down temperature rampings. The insets show how the current was drawn. Note the difference in film resistance when measured in parallel and across the tubes’ axis. (b) Randomly distributed -type film.
TE curves for randomly oriented MWCNT junctions laid side by side with a small overlapping zone. Both up (black curve) and down (brown curve) temperature scans are shown. Inset: the corresponding curve.
TE properties of the SWCNT, -type, and junctions: randomly dispersed and aligned samples are shown. Indicated are the overall resistance values. Both up (black curve) and down (brown curve) temperature scans are shown. Overall resistance between various samples could have varied because of film thickness and size difference in their overlapping zones.
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