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Photoluminescence and x-ray diffraction measurements of InN epifilms grown with varying ratio by plasma-assisted molecular-beam epitaxy
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10.1063/1.2937833
/content/aip/journal/apl/92/21/10.1063/1.2937833
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/21/10.1063/1.2937833
/content/aip/journal/apl/92/21/10.1063/1.2937833
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/content/aip/journal/apl/92/21/10.1063/1.2937833
2008-05-29
2014-10-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Photoluminescence and x-ray diffraction measurements of InN epifilms grown with varying In∕N ratio by plasma-assisted molecular-beam epitaxy
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/21/10.1063/1.2937833
10.1063/1.2937833
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