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A semiempirical model for two-level system noise in superconducting microresonators
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10.1063/1.2937855
/content/aip/journal/apl/92/21/10.1063/1.2937855
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/21/10.1063/1.2937855
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Fractional frequency noise spectra of the four CPW resonators measured at . (a) Noise spectra at . From top to bottom, the four curves correspond to CPW center strip widths of , 5, 10, and . The various spikes seen in the spectra are due to pickup of stray signals by the electronics and cabling. (b) Fractional frequency noise at as a function of . The markers represent different resonator geometries, as indicated by the values of in the legend. The dashed lines indicate power law fits to the data of each geometry.

Image of FIG. 2.
FIG. 2.

The measured fractional frequency noise at is plotted as a function of the center strip width . Values directly retrieved from power-law fits to the data in Fig. 1 are indicated by the open squares. Values corrected for the coupler’s contribution are indicated by the stars. The corrected values of scale as , as indicated by the dashed line.

Image of FIG. 3.
FIG. 3.

The calculated dimensionless noise scaling function is plotted as a function of the ratio between the CPW half film thickness and the center strip width . The inset shows the conformal mapping used to derive the electric field. The contour integral for is evaluated on the surface of the metal, as outlined by the solid lines in the -plane. Results are shown for four different values of the parameter that controls the edge shape (see inset). The dashed lines indicate power law fits to .

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/content/aip/journal/apl/92/21/10.1063/1.2937855
2008-05-29
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A semiempirical model for two-level system noise in superconducting microresonators
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/21/10.1063/1.2937855
10.1063/1.2937855
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