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The current image of a single CuO nanowire studied by conductive atomic force microscopy
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) A typical SEM image and an electron diffraction pattern (inset) of the prepared CuO nanowires. (b) The SEM image of a single CuO nanowire contacted by the evaporated Au film, and the schematic diagram of its electrical measurement using C-AFM (inset).

Image of FIG. 2.
FIG. 2.

(a) and (b) show topography image and current image of the CuO nanowire shown in Fig. 1(b), respectively. (c) and (d) show the cross section profiles for (a) and (b) at an identical place marked by a solid line, respectively. The circle in (b) marks the position for measurement.

Image of FIG. 3.
FIG. 3.

(a) The curve of the CuO nanowire measured at the position marked as a circle in Fig. 2(b). (b) The plot of the positive current with in log scale, which shows linear property.

Image of FIG. 4.
FIG. 4.

The topography image (a) and surface potential image (b) of a CuO nanowire on an Au film substrate measured by KFM.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The current image of a single CuO nanowire studied by conductive atomic force microscopy