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Characterization of electronic structure and defect states of thin epitaxial films by UV-visible absorption and cathodoluminescence spectroscopies
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10.1063/1.2939101
/content/aip/journal/apl/92/22/10.1063/1.2939101
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/22/10.1063/1.2939101
/content/aip/journal/apl/92/22/10.1063/1.2939101
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/content/aip/journal/apl/92/22/10.1063/1.2939101
2008-06-02
2014-10-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of electronic structure and defect states of thin epitaxial BiFeO3 films by UV-visible absorption and cathodoluminescence spectroscopies
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/22/10.1063/1.2939101
10.1063/1.2939101
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