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Advanced x-ray stress analysis method for a single crystal using different diffraction plane families
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10.1063/1.2912030
/content/aip/journal/apl/92/23/10.1063/1.2912030
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/23/10.1063/1.2912030
/content/aip/journal/apl/92/23/10.1063/1.2912030
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/content/aip/journal/apl/92/23/10.1063/1.2912030
2008-06-10
2015-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Advanced x-ray stress analysis method for a single crystal using different diffraction plane families
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/23/10.1063/1.2912030
10.1063/1.2912030
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