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Atomic scale characterization of buried quantum dots using pulsed laser atom probe tomography
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10.1063/1.2918846
/content/aip/journal/apl/92/23/10.1063/1.2918846
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/23/10.1063/1.2918846
/content/aip/journal/apl/92/23/10.1063/1.2918846
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/content/aip/journal/apl/92/23/10.1063/1.2918846
2008-06-13
2014-07-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Atomic scale characterization of buried InxGa1−xAs quantum dots using pulsed laser atom probe tomography
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/23/10.1063/1.2918846
10.1063/1.2918846
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