Full text loading...
X-ray diffraction scans of ZnO thin films on MgO substrates.
TEM micrographs of (a) bright field image for the full epitaxial layer and (b) high resolution image for the interface region. The insets show DDPs obtained from the marked square regions.
SADP at the interface indicating the -plane ZnO orientation and some degree of polycrystalline feature.
X-ray diffraction pole figure of the ZnO reflection at for the -plane ZnO epilayer on MgO. The tilt angle and rotation angle are defined along the radius and angle of the pole figure, respectively.
Article metrics loading...