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Index of refraction and extinction coefficient for PVO over a spectral range from 200 to . These values correspond to a parameterized PVO dielectric function obtained by fitting measured ellipsometric spectra in of a PVO film deposited on a LSAT substrate at three angles of incidence (, 65°, and 75°) to a three-medium optical model consisting of a semi-infinite LSAT substrate/bulk film/air ambient structure.
Variation of (a) and (b) polarized SHG intensity with incident polarization angle for a PVO(001)∥NGO(110) film with axis perpendicular to the plane of incidence for tilt angle about the axis of the film.
Variation of and as a function of tilt angle . The solid lines show theoretical fits to the data using which the ratios of nonlinear optical coefficients is extracted.
Optical model parameters corresponding to PVO microstructure and dielectric functions represented by a combination of a Lorentz oscillator, Tauc–Lorentz oscillator, and . (Mean square error ). Using the model, the thickness was estimated to be .
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