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(a) XRD pattern of the CBSTO film. (b) High-resolution TEM image of the cross-sectional specimen of CBSTO film on STO. The upper inset and the lower inset show the selected area diffraction pattern and the low magnification image of the interface, respectively.
Co -edge XANES spectra for CBSTO film with reference samples: Co metal and CoO.
A comparison of curves of the CBSTO/STO sample (a) and BSTO/STO sample (b) measured at . (c) curves of the CBSTO film at 300 and , respectively. (d) Magnetization measured at . (e) Hysteresis loops of the CBSTO film at after ZFC and FC processes. The enlarged view of loops for ZFC and FC processes (upper inset) and the first and the fifth field cycles after FC process (lower inset) were also shown.
(a) Permittivity of the CBSTO and BSTO thin film capacitors, respectively. (b) The ferroelectric hysteresis loops of CBSTO thin film.
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