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Experimental characterization of single-walled carbon nanotube film-Si Schottky contacts using metal-semiconductor-metal structures
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10.1063/1.2945644
/content/aip/journal/apl/92/24/10.1063/1.2945644
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/24/10.1063/1.2945644
/content/aip/journal/apl/92/24/10.1063/1.2945644
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/content/aip/journal/apl/92/24/10.1063/1.2945644
2008-06-18
2014-09-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Experimental characterization of single-walled carbon nanotube film-Si Schottky contacts using metal-semiconductor-metal structures
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/24/10.1063/1.2945644
10.1063/1.2945644
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