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Configuration of silicon sample and the measuring system for PE. (a) MIS configuration of silicon sample, whose size and orientation are denoted. (b) Experimental setup for PE measurements.
Dependence of electro-optic signals on the applied voltage. The electro-optic response is linear for the applied voltage changed from 10 up to .
Experimental setup for OR measurements. A half-wave plate is used for changing the azimuth of the linear polarization light.
The measured anisotropy of OR at the (111) surface of silicon crystal. The solid line is the fitting curve according to a cosine function with a period pi, which is in good accordance with the experimental data and the theory.
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