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Epitaxial growth and surface metallic nature of thin films
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10.1063/1.2955534
/content/aip/journal/apl/92/26/10.1063/1.2955534
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/26/10.1063/1.2955534
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Figures

Image of FIG. 1.
FIG. 1.

Characterization of LNO thin films: (a) specular RHEED intensity oscillations observed during LNO growth at . (b) AFM image of a -thick LNO thin film. The inset shows the RHEED pattern after deposition. (c) Reciprocal space mapping around the pseudocubic (114) reflection of a LNO film grown on a LAO substrate. The units for and are reciprocal lattice units. (d) Temperature-dependent resistivities of a LNO films grown under various oxygen pressures. The oxygen pressures during cooling are shown in brackets.

Image of FIG. 2.
FIG. 2.

Comparison of Ni x-ray absorption spectra from LNO, and NiO. Spectra of and NiO are taken from Ref. 20. For the Ni XAS spectrum of LNO, the La absorption peak (indicated by a dashed line) was subtracted from raw data, as shown in (b).

Image of FIG. 3.
FIG. 3.

Photoemission spectra of an epitaxial LNO film (red) and a LAO /LNO bilayer film (blue). The Fermi edge of Au is also shown for reference.

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/content/aip/journal/apl/92/26/10.1063/1.2955534
2008-07-03
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Epitaxial growth and surface metallic nature of LaNiO3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/26/10.1063/1.2955534
10.1063/1.2955534
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