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Measuring the electrical characteristics of individual junctions in the capped ZnO nanowire arrays on Zn substrate
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10.1063/1.2837060
/content/aip/journal/apl/92/3/10.1063/1.2837060
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/3/10.1063/1.2837060
/content/aip/journal/apl/92/3/10.1063/1.2837060
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/content/aip/journal/apl/92/3/10.1063/1.2837060
2008-01-23
2015-02-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Measuring the electrical characteristics of individual junctions in the SnO2 capped ZnO nanowire arrays on Zn substrate
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/3/10.1063/1.2837060
10.1063/1.2837060
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