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Side view (a) of AFM and heater configuration. 1: piezoscanner, 2: Macor tube, 3: second piezoelement, 4: sample, 5: ceramic plate with embedded heater filament, 6: Gap, 7: connection wires, and 8: support block to clamp the wires, top (b) and side (c) views of the heater.
(a) Sample temperature as a function of input power and pressure, ◼ and ▴ , ● , and ○ atmospheric pressure. (b) Quenching and heating response of the heating stage in ambient (○, ▵) and (●, ▴).
Free cantilever resonance frequency measured twice in as a function of heater temperature. Inset: frequency decrease at atmospheric pressure.
AFM topography images of a surface measured at in . In the first image, the substrate step ledge is colored white as a guide for the eye. Furthermore, markers are placed in the subsequent images to visualize the lateral drift for .
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