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High temperature surface imaging using atomic force microscopy
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10.1063/1.2836943
/content/aip/journal/apl/92/4/10.1063/1.2836943
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/4/10.1063/1.2836943
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Side view (a) of AFM and heater configuration. 1: piezoscanner, 2: Macor tube, 3: second piezoelement, 4: sample, 5: ceramic plate with embedded heater filament, 6: Gap, 7: connection wires, and 8: support block to clamp the wires, top (b) and side (c) views of the heater.

Image of FIG. 2.
FIG. 2.

(a) Sample temperature as a function of input power and pressure, ◼ and ▴ , ● , and ○ atmospheric pressure. (b) Quenching and heating response of the heating stage in ambient (○, ▵) and (●, ▴).

Image of FIG. 3.
FIG. 3.

Free cantilever resonance frequency measured twice in as a function of heater temperature. Inset: frequency decrease at atmospheric pressure.

Image of FIG. 4.
FIG. 4.

AFM topography images of a surface measured at in . In the first image, the substrate step ledge is colored white as a guide for the eye. Furthermore, markers are placed in the subsequent images to visualize the lateral drift for .

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/content/aip/journal/apl/92/4/10.1063/1.2836943
2008-01-28
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High temperature surface imaging using atomic force microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/4/10.1063/1.2836943
10.1063/1.2836943
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