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XRD patterns of CCTO grown on LNO and Pt.
Surface and cross-sectional SEM images of CCTO thin films grown on [(a) and (c)] LNO and [(b) and (d)] Pt.
The frequency dependence of capacitance and dielectric loss of CCTO thin films on LNO.
The complex impedance plane plot for the CCTO thin films grown on LNO. The upper inset shows the equivalent circuit used to represent the electrical properties of grain and grain-boundary effects and the lower inset shows the intercept on axis.
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