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Studies of oxide/ZnO near-interfacial defects by photoluminescence and deep level transient spectroscopy
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10.1063/1.2838326
/content/aip/journal/apl/92/4/10.1063/1.2838326
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/4/10.1063/1.2838326
/content/aip/journal/apl/92/4/10.1063/1.2838326
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/content/aip/journal/apl/92/4/10.1063/1.2838326
2008-01-28
2014-12-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Studies of oxide/ZnO near-interfacial defects by photoluminescence and deep level transient spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/4/10.1063/1.2838326
10.1063/1.2838326
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