Full text loading...
O , Ge , and Gd high resolution XPS spectra for the as-deposited (a), annealed (b), air exposed (c), and vacuum annealed (d) thick film Ge heterojunctions, respectively.
High resolution XPS spectra of a clean Ge substrate (a) and of thick sample (b). In the insets the linear extrapolation procedure of the valence band edge for the two samples.
and XPS core line positions and corresponding calculated VBO values for the as-deposited (a), annealed (b), air exposed (c), and vacuum annealed (d) heterojunctions, respectively.
Article metrics loading...