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Schematic diagram showing the dual port acoustic wave device. (a) is a plan view and (b) a magnified side view along the acoustic beam path, showing acoustic and fluidic displacement and subsequent particle alignment (not to scale).
(a) Micrograph showing long range alignment of particles using a SAW at optical magnification and (b) an illustration of the particle lines shown in (a) formed on the upper and lower interfaces of the fluidic channel.
Micrographs showing sections at magnification of aligned particles formed by (a) a device operating at frequencies of, from top to bottom, 31.0, 31.8, 32.5, 33.6, and , and (b) a device operating at frequencies of, from top to bottom, 94.8, 95.6, 96.4, 97.3, and . are the distances between four adjacent lines in each case; the average line separation is then given by .
The average line separation of latex particles for a device (circles), and a device (triangles) as a function of applied frequency. (Top axis shows frequency for the device, while the bottom axis is for the device) The dashed and solid lines are the calculated change in separation assuming for the 32.5 and devices, respectively. Data points are averaged from repeat measurements over a series of several line spaces, with error bars determined from the standard deviation for each average. The inset shows the measured and calculated separation for all the data.
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