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Valence band offset of heterojunction measured by x-ray photoelectron spectroscopy
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10.1063/1.2839611
/content/aip/journal/apl/92/4/10.1063/1.2839611
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/4/10.1063/1.2839611
/content/aip/journal/apl/92/4/10.1063/1.2839611
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/content/aip/journal/apl/92/4/10.1063/1.2839611
2008-01-31
2014-07-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Valence band offset of MgO∕InN heterojunction measured by x-ray photoelectron spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/4/10.1063/1.2839611
10.1063/1.2839611
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