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(a) Schematic of a cantilevered thermal probe in touch with the sample (not to scale). (b) Circuitry to measure the temperature dependent electric resistance of the probe.
(a) Topography image of the surface obtained in air using the standard AFM imaging technique (tapping mode). (b) Thermal signal image of the surface obtained in vacuum. The grayscale corresponds to approximately variation in the heater temperature.
Approach and retract curves measured using a heated tip.
Histogram of thermal resistance values obtained for pixels of Fig. 2 that could be clearly attributed to either or .
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