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Measurement of dispersive forces between evaporated metal surfaces in the range below
1.H. B. G. Casimir, Proc. K. Ned. Akad. Wet. 60, 793 (1948).
2.A. Cleland, Foundations of Nanomechanics (Springer, New York, 2003).
7.B. W. Harris, F. Chen, and U. Mohideen, Phys. Rev. A 62, 052109 (2000);
7.R. S. Decca, D. López, E. Fischbach, G. L. Klimchitskaya, D. E. Krause, and V. M. Mostepanenko, Eur. Phys. J. C 51, 963 (2007). Note that in none of these works, direct measurement of the optical properties by ellipsometry was performed. In contrast, either tabulated handbook data were used or limited accuracy conductivity measurements to determine the plasma frequency together with tabulated data for the relaxation in the Drude model were employed.
8.P. J. van Zwol, G. Palasantzas, and J. T. M. De Hosson, “Influence of Random Roughness on the Casimir Force at Small Separations,” Phys. Rev. B (to be published).
17.P. J. van Zwol, G. Palasantzas, and J. T. M. De Hosson, Appl. Phys. Lett. 91, 101905 (2007). Better accuracy is impossible since SEMS are usually calibrated by such spheres, for which the manufacturer states a few percent deviation in diameter.
20.This is because the van der Waals/Casimir force only could allow more bending of the cantilever to approach down to approximately , while jump to contact occurs at about that can only be explained by the presence of an attractive capillary force.
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