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Gas phase ionization mass spectrum recorded during stationary bombardment of an aluminum sample with a focused beam. The spectra were taken at two different base pressures in the analysis chamber. The inset shows the variation in signal at 44 upon rapidly changing, at time , from high to low pressure.
Variation of the signal during bombardment of a virgin Si sample with a focused ion beam.
Comparison of the measured flux of released helium with the He-to-Si concentration ratios calculated with a simple model of ion retention in the presence of sputtering. Note the double logarithmic scale.
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