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Torsional resonance atomic force microscopy in water
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10.1063/1.2841701
/content/aip/journal/apl/92/5/10.1063/1.2841701
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/5/10.1063/1.2841701
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic of the homebuilt cantilever cell used in this work.

Image of FIG. 2.
FIG. 2.

(a) Torsional amplitude response of a rectangular silicon nitride cantilever (Veeco MLCT AUHW, cantilever B) as a function of frequency in water. The is approximately 40. (b) Torsional amplitude (solid line) and normal force (dashed line) when approaching a PHB-V surface in water. The periodic variation on the normal force is due to mains electrical pickup on the sum/difference circuit and is not related to the tip-surface interaction.

Image of FIG. 3.
FIG. 3.

(a) Phase image of a PHB-V crystal growth front. The crystalline spherulite is the dark region to the right of the image; the light area to the left is the melt. The scale bar represents , grayscale represents 20°. (b) Section through image (a) along the line denoted by the arrows. (c) Topographic image of the core region of a PHB-V spherulite. The scale bar represents , grayscale represents . (d) Corresponding phase image of (c). The grayscale represents 3°.

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/content/aip/journal/apl/92/5/10.1063/1.2841701
2008-02-06
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Torsional resonance atomic force microscopy in water
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/5/10.1063/1.2841701
10.1063/1.2841701
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