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(a) Low magnification TEM bright field image of . (b) HRTEM image of the same stacking. (c) Fourier transform of the (b) HRTEM image.
Experimental (black line) and simulated (red line) reflectivity profiles from the XRR measurement of a multilayer.
TMR vs bias curves in MTJs at (open circles) and (full circles). Inset: TMR vs field curves at for ( TMR) and ( TMR).
Effective misfits between adjacent layers.
Density, thickness, and roughness of the layers extract from the simulation of XRR.
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