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(a) A low magnification SEM image of CNHs. [(b) and (c)] Enlarged SEM images of the catalyst particles at the tips of CNHs.
Series of TEM images and corresponding diffraction patterns of catalyst particles recorded along different crystallographic directions. In (a)–(d), the images and diffraction patterns are obtained by tilting a particle around the  axis (arrows in diffraction patterns). In (e) and (f), the images and diffraction patterns are recorded by tilting around the  axis. Details are described in the main text. A hexahedron model of the particle is shown in (g), and its projections are shown accompanying the image series.
The schematic growth model of the nanohelices.
The crystallographic index of the six possible surface planes , , and of the hexahedron; angles , , and , which are measured from the TEM images; and angles , , and , which are obtained from the projections of the hexahedron along the and directions.
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