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Compact high-resolution differential interference contrast soft x-ray microscopy
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10.1063/1.2842422
/content/aip/journal/apl/92/6/10.1063/1.2842422
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/6/10.1063/1.2842422
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

An illustration showing the basic pattern of two types of DIC DOEs and their corresponding PSFs. The only difference between the optics is the position of the phase cut. The corresponding PSF intensities are presented (continous lines) together with the PSF intensity of a normal zone plate (dashed lines). Shadings under the graphs show the relative phase of the PSFs.

Image of FIG. 2.
FIG. 2.

The figure shows the same region of the siemens star test object imaged by a normal zone plate and by the side-cut DOE. The contrast mechanism is clearly different in the two images. The left is based on absorption contrast, whereas the right image exhibits a strong DIC edge enhancement in addition to the ordinary absorption contrast.

Image of FIG. 3.
FIG. 3.

Comparison of average edge profiles obtained with the side-cut DOE (continuous line) and the normal zone plate (dashed line), measured between the two radii marked in Fig. 2 with spatial frequencies between 3 and .

Image of FIG. 4.
FIG. 4.

Contrast transfer functions of the side-cut DOE (continuous line) and the normal zone plate (dashed line) based on experimental data. These curves show that this type of DOE gives an enhanced contrast. Notice the maximum contrast increase by a factor of 2 at around .

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/content/aip/journal/apl/92/6/10.1063/1.2842422
2008-02-13
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Compact high-resolution differential interference contrast soft x-ray microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/6/10.1063/1.2842422
10.1063/1.2842422
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