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AFM image of an -plane GaN ELO template. The insets are RHEED patterns of the -plane GaN ELO template in the azimuths of (a)  and (b) .
Cross-sectional SEM picture of the DBR structure, where the arrows indicate voids.
RT microreflectivity spectra of the DBR (under linearly polarized light), perpendicular to the -axis (black solid line) and parallel to the -axis (gray dashed line). (b) Normalized LT (black solid line) and RT (gray dashed line) -PL spectra of the GaN stacked layers.
RT microtransmission spectra measured on the MC using linearly polarized light for various polarization angles. Dotted and dashed lines correspond to calculated transmission spectra for ordinary and extraordinary refractive indices, respectively. Vertical dashed lines are guides to the eye.
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