banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Over 40% transverse Kerr effect from
Rent this article for
View: Figures


Image of FIG. 1.
FIG. 1.

(a) Longitudinal MOKE configuration with magnetization and - and -polarized electric field components and , respectively. (b) Reflected electric field vectors and for opposite magnetization directions with longitudinal and -polarized incident light. (c) Transverse MOKE geometry. and for transverse MOKE with (d) -polarized incident light and (e) mixed - and -polarized incident light.

Image of FIG. 2.
FIG. 2.

Experimental (data points) and calculated (lines) transverse MOKE signals from a thick film as a function of incident polarization angle ( for polarization) with various indicated analyzer angles [● 0° (transmission axis parallel to polarization); ◼ 10°; ◆ 20°; ▴ 30°; ▾ 40°; ○ 50°; ◻ 60°; ◇ 70°; ▵ 80°; ▿ 90°].

Image of FIG. 3.
FIG. 3.

Calculated properties of linearly polarized light reflected from thick for opposite transverse magnetizations as a function of incident polarization angle ( for polarized). (a) Fractional intensity change , (b) average reflected polarization rotation from incident polarization, (c) difference in reflected polarization rotation for opposite transverse magnetization orientations, (d) average reflected ellipticity , and (e) ellipticity difference for opposite transverse magnetization orientations.

Image of FIG. 4.
FIG. 4.

Fractional transverse MOKE signal from a thick film as a function of analyzer angle using an incident polarization angle and a quarter-wave retardation plate for the polarization analysis. The inset shows a MOKE hysteresis loop with for averaged from . S/N remains greater than 500 up to .

Image of FIG. 5.
FIG. 5.

(a) Atomic force micrograph of thick dots on Si(001). (b) Fractional Kerr signal as a function of analyzer angle from extinction obtained from a array of dots without a quarter-wave retardation plate for transverse and longitudinal magnetizations and different incident polarizations . (c) Micrograph of a thick nanowire and pad on Si(001). (d) Transverse from the nanowire as a function of using a quarter-wave retardation plate for different . (e) Hysteresis loop obtained from the nanowire at and averaged from .


Article metrics loading...


Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Over 40% transverse Kerr effect from Ni80Fe20