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Over 40% transverse Kerr effect from
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10.1063/1.2884332
/content/aip/journal/apl/92/7/10.1063/1.2884332
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/7/10.1063/1.2884332
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Figures

Image of FIG. 1.
FIG. 1.

(a) Longitudinal MOKE configuration with magnetization and - and -polarized electric field components and , respectively. (b) Reflected electric field vectors and for opposite magnetization directions with longitudinal and -polarized incident light. (c) Transverse MOKE geometry. and for transverse MOKE with (d) -polarized incident light and (e) mixed - and -polarized incident light.

Image of FIG. 2.
FIG. 2.

Experimental (data points) and calculated (lines) transverse MOKE signals from a thick film as a function of incident polarization angle ( for polarization) with various indicated analyzer angles [● 0° (transmission axis parallel to polarization); ◼ 10°; ◆ 20°; ▴ 30°; ▾ 40°; ○ 50°; ◻ 60°; ◇ 70°; ▵ 80°; ▿ 90°].

Image of FIG. 3.
FIG. 3.

Calculated properties of linearly polarized light reflected from thick for opposite transverse magnetizations as a function of incident polarization angle ( for polarized). (a) Fractional intensity change , (b) average reflected polarization rotation from incident polarization, (c) difference in reflected polarization rotation for opposite transverse magnetization orientations, (d) average reflected ellipticity , and (e) ellipticity difference for opposite transverse magnetization orientations.

Image of FIG. 4.
FIG. 4.

Fractional transverse MOKE signal from a thick film as a function of analyzer angle using an incident polarization angle and a quarter-wave retardation plate for the polarization analysis. The inset shows a MOKE hysteresis loop with for averaged from . S/N remains greater than 500 up to .

Image of FIG. 5.
FIG. 5.

(a) Atomic force micrograph of thick dots on Si(001). (b) Fractional Kerr signal as a function of analyzer angle from extinction obtained from a array of dots without a quarter-wave retardation plate for transverse and longitudinal magnetizations and different incident polarizations . (c) Micrograph of a thick nanowire and pad on Si(001). (d) Transverse from the nanowire as a function of using a quarter-wave retardation plate for different . (e) Hysteresis loop obtained from the nanowire at and averaged from .

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/content/aip/journal/apl/92/7/10.1063/1.2884332
2008-02-21
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Over 40% transverse Kerr effect from Ni80Fe20
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/7/10.1063/1.2884332
10.1063/1.2884332
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