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Resonance frequency analysis for surface-coupled atomic force microscopy cantilever in ambient and liquid environments
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10.1063/1.2801524
/content/aip/journal/apl/92/8/10.1063/1.2801524
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/8/10.1063/1.2801524
/content/aip/journal/apl/92/8/10.1063/1.2801524
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/content/aip/journal/apl/92/8/10.1063/1.2801524
2008-02-25
2014-12-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Resonance frequency analysis for surface-coupled atomic force microscopy cantilever in ambient and liquid environments
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/8/10.1063/1.2801524
10.1063/1.2801524
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