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Electron dephasing in nanocrystalline silicon thin films
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10.1063/1.2840179
/content/aip/journal/apl/92/8/10.1063/1.2840179
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/8/10.1063/1.2840179
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Magnetic field dependence of the magnetoconductivity in the nc-Si:H sample at . (b) Low magnetic field magnetoconductivity of the nc-Si:H sample at different temperatures. Solid curves are the DFS fittings of the experimental data (open squares).

Image of FIG. 2.
FIG. 2.

(a) Temperature dependence of dephasing lengths extracted from the DFS fitting process (open squares). The solid curve represents an exponential fit which yields a temperature exponent of , differing from the result of according to 3D scaling theory (dashed curve). (b) Temperature dependence of magnetoconductivity under low magnetic fields . The experimental data (open squares) are fitted by a combined model of 2D and 3D scaling theories (solid curves), giving a temperature index .

Image of FIG. 3.
FIG. 3.

Magnetoconductivity under very low magnetic fields at temperatures of (a) , (b) , and (c) . Dashed curves represent the DFS calculations that deviate from the experimental data (open squares), in contrast to the modified results by a combination of the DFS theory and 3D correction from the scaling theory (solid curves).

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/content/aip/journal/apl/92/8/10.1063/1.2840179
2008-02-25
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electron dephasing in nanocrystalline silicon thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/8/10.1063/1.2840179
10.1063/1.2840179
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