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Surface plasmon polariton modes in a single-crystal Au nanoresonator fabricated using focused-ion-beam milling
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View: Figures


Image of FIG. 1.
FIG. 1.

(a) Scanning electron micrograph of a -long linear ridge fabricated in a single-crystal Au substrate using focused-ion-beam milling. The ridge is approximately high and wide. (b) The same ridge from a different angle. (c) Boundary-element-method calculation of the field intensity near an infinitely long bell-shaped Au ridge. This calculation, performed at a photon energy and , shows that propagating surface plasmons at this energy are well confined to the top of the ridge and do not couple to the planar-surface plasmons, for which .

Image of FIG. 2.
FIG. 2.

(a) Light emission from the ridge at wavelength upon irradiation with a electron beam, as function of electron beam position. (b) Cathodoluminescence emission from a single-crystal Au ridge as function of electron beam position and wavelength, measured along the major axis of the ridge [see dashed line in (a)]. The ridge position is indicated by the bar to the right of the plot. A broad spectrum is emitted when the electron beam dwells on the ridge ends, while the signal from the ridge center is more sharply wavelength dependent. (c) Reconstruction of the data from a fit using a modeling factor-analysis method with a Lorentzian shape imposed on five independent spectra, labeled 1–5 and plotted in (d). The calculated data set in (c) closely matches the experimental data in (b).

Image of FIG. 3.
FIG. 3.

Line profiles obtained by a fit of the data in Fig. 2(b) using the modeling factor-analysis method of Fig. 2. Each consecutive profile is shifted by one intensity unit for clarity. Numbers labeling each profile correspond to respective spectra of Fig. 2(d). Profiles 3 and 4 show resonant modes of the ridge with one and two antinodes on the ridge, respectively.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Surface plasmon polariton modes in a single-crystal Au nanoresonator fabricated using focused-ion-beam milling