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XRD patterns of the as-prepared and annealed samples.
SEM and TEM images of the as-prepared samples: (a) SEM image of S1, the inset shows ZnO nanorod clusters caused by aggregation, (b) SEM image of S2, (c) TEM image of S1, of which the inset is the high-resolution TEM image of the ZnO nanorods, and (d) TEM image of S2.
TEM images of the annealed samples: [(a), (c), and (d)] annealed S1 and [(b) and (e)] annealed S2.
curves of the as-prepared and annealed samples.
RT PL spectra of the samples: (a) as prepared and (b) annealed.
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