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Doping characterization of quantum dot heterostructure by cross-sectional scanning capacitance microscopy
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10.1063/1.2889938
/content/aip/journal/apl/92/9/10.1063/1.2889938
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/9/10.1063/1.2889938
/content/aip/journal/apl/92/9/10.1063/1.2889938
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/content/aip/journal/apl/92/9/10.1063/1.2889938
2008-03-03
2014-07-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Doping characterization of InAs∕GaAs quantum dot heterostructure by cross-sectional scanning capacitance microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/9/10.1063/1.2889938
10.1063/1.2889938
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