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Optical second harmonic generation from the twin boundary of ZnO thin films grown on silicon
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10.1063/1.2891334
/content/aip/journal/apl/92/9/10.1063/1.2891334
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/9/10.1063/1.2891334
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The x-ray patterns of ZnO films deposited on Si(111) at different substrate temperature. The inset shows the stress calculated by the XRD profiles and peak shifts of the ZnO (0002) peak.

Image of FIG. 2.
FIG. 2.

The -polarized RSHG pattern excited with -polarized light acquired with a ZnO film on Si(111) substrate deposited at a temperature of 100, 200, and .

Image of FIG. 3.
FIG. 3.

The arrow indicates the direction of the nonvanishing polarity from the O to the Zn atoms on the twin boundary. The dashed line denotes the twin boundary in ZnO along the zone axis (Ref. 7).

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/content/aip/journal/apl/92/9/10.1063/1.2891334
2008-03-06
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical second harmonic generation from the twin boundary of ZnO thin films grown on silicon
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/9/10.1063/1.2891334
10.1063/1.2891334
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