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Relaxation processes of point defects in vitreous silica from femtosecond to nanoseconds
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10.1063/1.2975965
/content/aip/journal/apl/93/10/10.1063/1.2975965
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/10/10.1063/1.2975965

Figures

Image of FIG. 1.
FIG. 1.

TA as a function of pump-probe time delay for the Ge doped and undoped samples (triangles and circles, respectively). The total outcome (bold solid line) of fitting procedure in terms of the sum of two exponential decays and of a modified power-law (solid, dashed and double-point-dash lines, respectively) is reported [see Eqs. (1) and (2) and Table I].

Image of FIG. 2.
FIG. 2.

Combination of time-resolved data from Fig. 1 (white triangles) with luminescence decay measurements from 2 to 40 ns (gray diamonds). Solid and dashed lines display the best fit using Eq. (1) and with a single exponential decay, respectively.

Tables

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Table I.

Amplitude , time constant and exponent for the power-law decay component and amplitudes and time constants for the biphasic exponential decay obtained from fitting the time domain data in Figs. 1 and 2 in terms of Eq. (1) and (2). The reported errors are twice the standard deviation.

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/content/aip/journal/apl/93/10/10.1063/1.2975965
2008-09-08
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Relaxation processes of point defects in vitreous silica from femtosecond to nanoseconds
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/10/10.1063/1.2975965
10.1063/1.2975965
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