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Submicrometer periodic patterns fixed by photopolymerization of dissipative structures
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10.1063/1.2990762
/content/aip/journal/apl/93/13/10.1063/1.2990762
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/13/10.1063/1.2990762

Figures

Image of FIG. 1.
FIG. 1.

Stability diagram showing the dependence of stable and instable regions, depending on frequency and voltage (peak-to-peak) for the investigated mixture. The vertical line at about 16 Hz indicates the critical frequency between the conductive regime (low frequencies) and the dielectric regime (high frequencies).

Image of FIG. 2.
FIG. 2.

Coarse surface modulation and surface cross section of a polymer film obtained from the chevron pattern that appears in the dielectric regime (here: 65 Hz, 57 V). The periodicity of this structure is about . The UV radiation intensity was .

Image of FIG. 3.
FIG. 3.

AFM images of the sample shown in Fig. 2 with different resolutions. The fine structure exhibits a periodicity as small as .

Tables

Generic image for table
Table I.

Composition of the investigated mixtures.

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/content/aip/journal/apl/93/13/10.1063/1.2990762
2008-09-29
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Submicrometer periodic patterns fixed by photopolymerization of dissipative structures
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/13/10.1063/1.2990762
10.1063/1.2990762
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