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Stability diagram showing the dependence of stable and instable regions, depending on frequency and voltage (peak-to-peak) for the investigated mixture. The vertical line at about 16 Hz indicates the critical frequency between the conductive regime (low frequencies) and the dielectric regime (high frequencies).
Coarse surface modulation and surface cross section of a polymer film obtained from the chevron pattern that appears in the dielectric regime (here: 65 Hz, 57 V). The periodicity of this structure is about . The UV radiation intensity was .
AFM images of the sample shown in Fig. 2 with different resolutions. The fine structure exhibits a periodicity as small as .
Composition of the investigated mixtures.
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