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Raman backscattering spectra of sample A (a), B (b), and C (c), and their respective and peak fitting curves. All samples are prepared at , and each spectrum is subtracted by baseline.
Raman spectra of ZnO series samples grown on quartz with (a) and (b), as oxidation precursors (a) grown at 450, 500, and with the thickness of , , and , respectively, (b) grown at 450, 500, and with the thickness of , , and , respectively.
SIMS depth profiles of sample B (solid) and C (dash dot).
HRTEM images and corresponding ED patterns of two typical appearances of sample C (a) nanoclusters beside grain boundaries (b) well arranged crystal lattice inside grains (c) ED of (a) region (d) ED of (b) region.
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