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Reflectance (thick lines) and transmittance (thin lines) spectra for samples 1 (solid lines) and 2 (dashed lines).
Schematic diagram of a silicon sample.
Refractive index for samples 1 (solid line) and 2 (dashed line) and the samples in Refs. 1–5, 16–18, and 26. The inset is the extinction coefficient spectrum for the thick silicon sample.
Extinction coefficient for samples 1 (thick solid line) and 2 (thick dashed line) and the samples in Refs. 18–20 and 29.
Characteristics of the silicon samples.
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