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Optical constants of silicon in near infrared region
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10.1063/1.2994669
/content/aip/journal/apl/93/13/10.1063/1.2994669
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/13/10.1063/1.2994669

Figures

Image of FIG. 1.
FIG. 1.

Reflectance (thick lines) and transmittance (thin lines) spectra for samples 1 (solid lines) and 2 (dashed lines).

Image of FIG. 2.
FIG. 2.

Schematic diagram of a silicon sample.

Image of FIG. 3.
FIG. 3.

Refractive index for samples 1 (solid line) and 2 (dashed line) and the samples in Refs. 1–5, 16–18, and 26. The inset is the extinction coefficient spectrum for the thick silicon sample.

Image of FIG. 4.
FIG. 4.

Extinction coefficient for samples 1 (thick solid line) and 2 (thick dashed line) and the samples in Refs. 18–20 and 29.

Tables

Generic image for table
Table I.

Characteristics of the silicon samples.

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/content/aip/journal/apl/93/13/10.1063/1.2994669
2008-10-03
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical constants of silicon in near infrared region
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/13/10.1063/1.2994669
10.1063/1.2994669
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