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Phase separation and optical properties in oxygen-rich InN films
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View: Figures


Image of FIG. 1.
FIG. 1.

XRD patterns of (a) InN-metal film and (b) InN-oxide film. The indicates the substrate peak due to the (0006) reflection. HRTEM of (c) InN-metal and (d) InN-oxide thin films. In (c) “G” shows the grain-boundary region between the highly oriented InN columnar crystals. In (d) regions marked with letters “a” and “c” indicate the disordered amorphous and crystalline regions within the InN crystallites.

Image of FIG. 2.
FIG. 2.

XPS spectra of after etching for (a) InN-metal and (b) InN-oxide thin films. electron spectra for the (a) and (b) are shown in (c) and (d). The concentration (at. %) of In, N, and O below the surface of (e) InN-metal and (f) InN-oxide films.

Image of FIG. 3.
FIG. 3.

Raman spectra of (a) InN-metal and (b) InN-oxide thin films. The corresponds to the peaks at 129 and modes (Ref. 21) from . Reflection spectra for InN films (a) and (b) are shown in (c) and (d). The solid curve is experimental data and the dashed curve is theoretical fit. The insets to (c) and (d) show the photoluminescence spectra, which exhibit broad peaks near corresponding to the optical absorption edge of the samples. The sharp feature at in the inset to (d) is due to the sapphire substrate, while the sharp peak at is the residue left after filtering the laser line.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Phase separation and optical properties in oxygen-rich InN films