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Interface as the origin of ferromagnetism in cobalt doped ZnO film grown on silicon substrate
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10.1063/1.2989128
/content/aip/journal/apl/93/14/10.1063/1.2989128
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/14/10.1063/1.2989128
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

-edge XANES spectra for film with reference materials: CoO and Co metal.

Image of FIG. 2.
FIG. 2.

In-plane and out-of-plane magnetization data measured at RT for thin film grown on Si(001). In the upper-left inset is expanded view of the in-plane curve. The lower-right inset shows in-plane magnetization curve when the film was etched off by .

Image of FIG. 3.
FIG. 3.

(a) and (b) core-level XPS spectra for the -(labeled as A) and HF-etched (labeled as B) samples. The binding energies were calibrated with respect to at 284.6 eV.

Image of FIG. 4.
FIG. 4.

Magnetization vs temperature for etched sample before (open downtriangles) and after (open uptriangles) HF cleaning under a field of 2000 Oe. The difference of these two curves reveals the net magnetic moment of interface (open circles).

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/content/aip/journal/apl/93/14/10.1063/1.2989128
2008-10-10
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Interface as the origin of ferromagnetism in cobalt doped ZnO film grown on silicon substrate
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/14/10.1063/1.2989128
10.1063/1.2989128
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