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-edge XANES spectra for film with reference materials: CoO and Co metal.
In-plane and out-of-plane magnetization data measured at RT for thin film grown on Si(001). In the upper-left inset is expanded view of the in-plane curve. The lower-right inset shows in-plane magnetization curve when the film was etched off by .
(a) and (b) core-level XPS spectra for the -(labeled as A) and HF-etched (labeled as B) samples. The binding energies were calibrated with respect to at 284.6 eV.
Magnetization vs temperature for etched sample before (open downtriangles) and after (open uptriangles) HF cleaning under a field of 2000 Oe. The difference of these two curves reveals the net magnetic moment of interface (open circles).
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