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Ferroelectric domain wall pinning at a bicrystal grain boundary in bismuth ferrite
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10.1063/1.2993327
/content/aip/journal/apl/93/14/10.1063/1.2993327
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/14/10.1063/1.2993327
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Topography and (b) schematic of GB cross section. Red and blue lines in (b) represent the piezoresponse signal. [(c) and (d)] PFM amplitude and phase images, respectively, of a region switched uniformly with positive tip bias and backswitched with an increasing negative bias. [(e) and (f)] PFM amplitude and phase images, respectively, of a region switched with a negative bias and backswitched with an increasing positive bias. Scales are (a) 30 nm, [(c) and (e)] 3 mV, and [(d) and (f)] . The dashed white lines indicate the location of the GB. In [(d) and (f)], bright (dark) contrast corresponds to an out-of-plane polarization component, which points toward (away from) the substrate.

Image of FIG. 2.
FIG. 2.

(a) Topography and [(b) and (c)] PFM amplitude and phase images, respectively, of a region switched with a negative bias and backswitched in several locations by positive dc-bias pulses. [(d)–(f)] PFM phase images following the application of additional dc-bias pulses. Scales are (a) 10 nm, (b) 3 mV, [(c)–(f)] . Images (c)–(f) are compensated for a phase offset. The dashed white lines indicate the location of the GB. White “x” marks in [(d)–(f)] indicate the location of the tip during the application of additional bias pulses.

Image of FIG. 3.
FIG. 3.

(a) Topography, (b) current image, and (c) selected current-voltage curves. Scale for (b) is . The dashed white line in (a) indicates the location of the GB. The dark contrast in (b) is indicative of increased leakage.

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/content/aip/journal/apl/93/14/10.1063/1.2993327
2008-10-06
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ferroelectric domain wall pinning at a bicrystal grain boundary in bismuth ferrite
http://aip.metastore.ingenta.com/content/aip/journal/apl/93/14/10.1063/1.2993327
10.1063/1.2993327
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