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Toward conductive traces: Dip Pen Nanolithography® of silver nanoparticle-based inks
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Image of FIG. 1.
FIG. 1.

Schematic representation of the DPN procedure used to pattern AgNP ink on a substrate. This procedure is common to other substrates.

Image of FIG. 2.
FIG. 2.

(a) Optical microscopy image of the process of bleeding excess AgNP ink with both the cantilever and tip (scale ). (b) Representative AFM topography image of silver dots generated by increasing tip-substrate contact times [(A)–(F)] (scale ). The identification letter, tip contact time, and measured diameter of the dots are (A) , ; (B) , ; (C) , ; (D) , ; (E) , ; (F) , . The image shows the dots postcuring and the dotted line shows the region where the topography line trace was measured. (c) Cross-sectional topography trace of the dots in (b) showing an average feature height of approximately . (d) Average AgNP dot diameter curves plotted as a function of dwell time compared to those of a typical chemisorbed DPN ink (MHA). The error bars represent standard deviations of five AgNP and twelve MHA DPN experiments.

Image of FIG. 3.
FIG. 3.

AFM topography image of AgNP lines generated via a tip speed of in a area. (a) linewidth, (b) linewidth, (c) linewidth, and (d) linewidth. The cross-sectional topography traces of (a)–(d) are shown below, while the scale bars in (a)–(d) are each. All lines shown were imaged postcuring.


Generic image for table
Table I.

Comparison of the three different AgNP ink systems used in this work.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Toward conductive traces: Dip Pen Nanolithography® of silver nanoparticle-based inks