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XRD patterns of (b) , (c) , (d) , particles, and (a) the standard data for bulk (Ref. 14).
SEM images of particles annealed at (inset is the enlarged image of the same sample).
CL spectra of (a) and (b) ions in particles.
The dependence of CL intensity (592 nm) of particles on the (a) excitation voltage and (b) current density.
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